Defect detection

General Description

The module is used to detect semiconductor structure defects. After training another model, it can be used to detect other such anomalies.

The code is shared between Few-shot Key Point Detection and Defect detection. Both modules use the same database, but ultimately have different functionalities because they differ in the models they use. This description will be expanded in the near future.

Resource Link
Source code https://gitc.piap.lukasiewicz.gov.pl/ai-prism/wp4/ai-based-perception-modules/object_and_defect_detection
Demo Video https://gitc.piap.lukasiewicz.gov.pl/ai-prism/reference-architecture/docs/guides/video/vigo_pilot.mp4

Contact

The following table includes contact information of the main developers in charge of the component:

Name email Organisation
Miron Kolodziejczyk miron.kolodziejczyk@piap.lukasiewicz.gov.pl logo image

License

Commercial

Technical Foundations

Integrated and Open Source Components

mmpose https://github.com/open-mmlab/mmpose

License

Apache-2.0 license

How to install

TBD

How to use

See above.